Get in Touch with Us

Let's Collaborate. Call to discuss your need and schedule a demonstration. We are experts in Atomic Force Microscopy and roughness applications.

Comparisons between AFM and profilometry can yield exciting results for your metrology on soft materials. Many contracts specify roughness values that are difficult to meet with existing tools.

Gary Williams - 209-345-2316

alt. e-mail at gary@garywilliamsinst.com

We welcome the opportunity to connect with you for potential collaborations, inquiries, or to discuss your upcoming projects. Our team is eager to engage with you and help bring your creative visions to life.